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II LIGA
Dołączył: 21 Lut 2011
Posty: 227
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Wysłany: Wto 15:16, 12 Kwi 2011 |
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Than the length gauge
bichangyi
than the length gauge
comparator
a non -contact optical targeting methods aimed at the measured length , mainly used to measure the distance lined Precision length measurement tool.
commonly used than the length gauge measuring microscope or optical microscope as a target positioning components , and precision line scale scale or wavelength of light as a known length, with the value determined by comparing the measured length . Than the length gauge is mainly used for test line scale , measuring partition board spacing, and physics, astronomy class on the photographic film from the light spectrum can also be used to measure the aperture.
according to the structure than the length gauge layout is divided into two types of vertical and horizontal . Instrument than the length of the vertical line scale used as a known length , and the structure designed to meet the Abbe principle (see length measurement tool) , known as Abbe than the length gauge (see [ Abe than the length gauge ]). Measurement, the first target tested by measuring microscope line, read from a numerical reading microscope . Then move the table , and then another test aimed at measuring microscope line, read from the reading microscope to another value. The difference between these two values is the measured distance between the two lines . Lateral length than the length gauge and the known length is measured parallel layout , this layout can reduce the track length, but requires high precision guides . By Aibinsitan optical system, the principle of compensation structure does not meet the Abbe produced by measurement error. A photoelectric microscope instead of the two microscopes are called optical instrument than long ; by laser or other monochromatic light wavelengths as those of known length , called the laser apparatus and optical light than the longer instrument than the length . Abbe longer than the measuring accuracy of ± 1 ~ ± 1.5 micron / 200 mm long optical instrument can be achieved than ± 0.5 micron / 1000 mm, while the optical and laser light than the longer instrument than the length of ± 0.2 microns can be / 1000 mm. Sun Chung rights
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